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Focused Ion Beam Circuit Edit

Microstructural Characterization

Crystallographic Analysis

Elemental Analysis

Spectroscopic Energy Analyzer

Failure Analysis of Samples

Focused Ion Beam Circuit Edit

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Application Items

Circuit Edit, Test Pad , WLCSP Circuit Edit Solution.

Specifications

The application capability can reach 7nm process chips.

Backside FIB Circuit Edit.

W+PT+SiO2 Dep.

GDS Navigation and positioning system.

Related Solutions

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