Electrical Testing
The primary purpose of chip electrical testing is to ensure that a chip’s electrical performance meets design specifications, thereby guaranteeing its reliability and stability in real-world applications. Through electrical testing, parameters such as power consumption, current, voltage, and resistance under normal operating conditions can be evaluated to confirm whether they meet expectations across various operating environments.Electrical testing involves measuring key parameters—including current, voltage, power, and impedance—based on injecting electrical signals into the chip and analyzing its response to determine its electrical characteristics.Our laboratory’s electrical testing services are mainly divided into two categories: static testing and reliability testing.
Chip Static Testing
• I-V electrical characterization (I-V curve)
• Probe signal measurement
• Nano-probe electrical testing
Chip Reliability Testing
• Electrostatic discharge / Electrical Overstress / Latch-up testing (ESD / EOS / Latch-up)
• Transverse electromagnetic (TEM) cell immunity testing
• Near-field scanning measurements
• Transmission Line Pulse and Very Fast Transmission Line Pulse testing (TLP & VFTLP)
